Manuale d’uso / di manutenzione del prodotto 16760A del fabbricante Agilent Technologies
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Agilent T echnologies 16760A Logic Analyzer Help V olume © 1992- 2002 Agi lent T echnologie s. All rights reserved ..
2 Agilent T echnologies 16760A Logic Analyz er The Agi lent T echnolo gies 16760A 1500 Mb/s Sta te/800 MHz T iming logic analyzer offe rs 64 M deep memory with up to 170 channels on a single ti me base (5 cards, 34 channe ls per card). Differen tial probing captures input signals as low as 200 m V p-p.
3 Agilent T echnologi es 16760A Logic Anal yz er • “Edi ting th e T rigg er Se quen ce (T i min g or 200 , 400 Mb/s Sta te On ly)” on page 78 • “Edi ting Ad vanced Trigger Funct ions ( T im .
4 Agilent T echnologie s 16760A Logic Analyzer See Also Main System Help (see the Agilent T echnologies 16700A/B-Series Logic Analy sis Sy stem help volume) Glossary (see page 263 ).
5 Contents Agilent Technologies 167 60A Logic Analyzer 1 Getting Started Probing and Sam pling Mode Selection Steps 15 Step 1. Connect lo gic analyzer to the device under te st 15 Step 2. Choose the sam pling mode 16 Step 3. Format la bels for the pro bed sign als 19 Timing Mo de or State Mode Steps 22 Step 4.
6 Contents Choosing the Sam pling Mode 43 Selecti ng the T iming M ode (A synchron ous Sam pling) 43 Selec ting the State Mod e (Synchron ous Sampli ng) 46 In Eith er T iming M ode o r Stat e Mod e 53.
Contents 7 Using Sy mbols 101 To load object file sy mbols 10 2 To adjust symbol values for relocated code 1 03 To crea te user -def ined sy mbols 104 To ente r symbo lic lab el val ues 105 To create an AS CII symbol fi le 106 To cr eate a rea ders.
8 Contents Displaying Capture d Eye Scan Data 133 To open the Eye Scan displ ay 133 To sele ct the channel s disp layed 134 To scale the Eye Scan disp lay 135 To se t Eye Sc an d ispla y option s 136 .
Contents 9 The Eye Scan Tab 204 Labels Subta b 204 Scan Se ttin gs S ubtab 205 Advanced Subtab 206 Qual ifier Subta b 208 Comments Subtab 209 The Calibration T ab 210 Error Messag es 211 Analyze r arm.
10 Contents Specifications and Characteristics 227 E5378A Singl e-Ended Probe Spe cifications and Characte ristics 228 E5379A D ifferenti al Probe Specificatio ns and Cha racteristics 228 E5380A MICTO.
Contents 11 Glossary Index.
12 Contents.
13 1 Gett ing Starte d After you have connected the logic analyzer probes to your device under test (see “ Step 1. Connect logic analyzer to the device under test” on page 15), all measurements wi.
14 Chapter 1: Getting St arted • “Step 2. Choos e the samp ling mode” on page 16 • “Step 3. Forma t la bels for th e pro bed s ignal s” o n page 19 In the timing ( asynchronous) or state (synchronous) sam pling modes, measurements wil l have these steps: • “Step 4.
15 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps Probing and Sampling Mo de Selection Steps Y ou will always take the following steps regar dless of the sampling mode you plan to use. • “Step 1. Connec t log ic ana lyze r to th e de vice under t est” on p age 15 • “Step 2.
16 Chapter 1: Getting St arted Probi ng and Samplin g Mode Selecti on Step s Step 2. Choose the sampl ing mode There are t hree logic analyzer samp ling modes to choose fro m: tim in g mode , state m ode , and eye scan mode . In timing mode , the logic analyzer samples asynchronou sly , based on an internally- generated sampling clock.
17 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps If you chose T iming Mo de 1. Select the timing anal yzer conventio nal/transitional configuration . In the transiti onal timing configurat ion, the logic analyzer can captu re a gre ater period of executio n because only tran sitions are stored in memory .
18 Chapter 1: Getting St arted Probi ng and Samplin g Mode Selecti on Step s 3. Speci fy the sa mpling positio n. Sele ct the Sampling Pos itions... button , then select the Run Eye Finder butto n to locate the data valid window in relat ion to the samp ling c lock, a nd autom atical ly set the sam pling positio n of th e logic anal yzer .
19 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps Step 3. Format labels for the probed si gnals When a logic analy zer probes hundreds of si gnals in a device under test, you need to be able to give t hose channels m o re meaningf ul names t han "pod 1, channel 1" .
20 Chapter 1: Getting St arted Probi ng and Samplin g Mode Selecti on Step s T o assign pods to the logi c analyzer 1. In the F ormat tab, sele ct the Pod Assignment bu tton. 2. In the Pod Assignment dialog, drag a po d to the appropriate lo gic analyzer .
21 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps Defined thr eshold vol tage. 7. Sele ct the Clo se but ton. 8. Sele ct the Clo se but ton. T o assign names t o logic ana l yzer ch annels 1. Sele ct a labe l butto n, and ei ther: • Cho o se th e Rename c ommand, enter th e labe l nam e, and select th e OK button.
22 Chapter 1: Getting St arted T imi ng Mo de or St ate Mode S teps T iming Mode or State Mode Steps When you have sele cted the timing or state sampl ing modes, you need to perform the following steps. • “Step 4. Define t he t rigger condi tion” on p age 2 2 • “Step 5.
23 Chapte r 1: Gettin g Started T iming Mode or Stat e Mode Steps 2. In the T rigger Seq uence port ion of th e T rigger tab, sel ect the but tons to define the l abel values and/ or other condi tions you want to tri gger on. Next: “Step 5. Run the measurement” on page 23 Step 5.
24 Chapter 1: Getting St arted T imi ng Mo de or St ate Mode S teps Logic analyzers with deep acquisition memory ta ke a noticeable amount of time t o complete a run; howe ver , messages like "W aiting in leve l 1" may indic ate you need to st op the measureme nt and refine t he trigger condit ion .
25 Chapte r 1: Gettin g Started T iming Mode or Stat e Mode Steps T o add display to ols via the W orkspace wi ndow 1. Select th e W orkspace button (or from the W i ndow menu, select Syst em and W orkspace). 2. I n the W orkspa ce wi ndow , scro ll down t o the Display p ortion of the too l icon list.
26 Chapter 1: Getting St arted Eye Scan M ode St eps Eye Scan Mode Steps When you have selected the e ye scan sampling mode, yo u need to perform t he follo wing steps. • “Step 4. Selec t channe ls for the eye scan measure ment” on page 26 • “Step 5.
27 Chapte r 1: Gettin g Started Eye Scan M ode St eps Next: “Step 5. Set the eye scan rang e and resolution” on pag e 27 Step 5. Set the eye scan range a nd resolution 1. In the Ey e Scan ta b, Scan Settings subtab , select the set tings fo r the eye scan measurement.
28 Chapter 1: Getting St arted Eye Scan M ode St eps These se ttings de fine the number and size of the time and voltag e windows used in th e eye scan. Meas uremen ts using the coar se settings r u n fa ster because ther e are fewer time and voltage windows to scan, but the resulting eye diagrams have less resolut ion.
29 Chapte r 1: Gettin g Started Eye Scan M ode St eps Once the eye scan settings have been selected , you can run the measurement. 1. Select th e Run Single button . The Eye Scan display wi ndow opens, and the capture d measureme nt data begi ns to ap pear .
30 Chapter 1: Getting St arted Eye Scan M ode St eps In the Eye Scan display window , use the following subtab s: • Scale to zoom in or out o n the cap tured data. • Displ ay to c hange the displa y optio ns. • Measurements to use tools for di splayi ng useful informati on about the data.
31 Chapte r 1: Gettin g Started For More Informa tion... For More Information... On conn ecting the logic anal yzer: • “Pr obing th e Device Under T est” on pa ge 35 • Set up Assistant (see the Setup As sist ant help vol ume) (when usin g analysis probes).
32 Chapter 1: Getting St arted For More Informa tion... • Using the Cha rt Displa y T oo l (see th e Chart Display T ool help volume ) • Us ing the Distri bution Disp lay T ool (see the Distributi.
33 2 Probing and Selecting the Sampli ng Mode • “Prob ing the Dev ice Und er T est” on p age 35.
34 Chapt er 2: Probing and Sele cting the Sampl ing Mode • “Choosing the Sampl ing Mode” on page 4 3 • “Selectin g the Timing Mode (Async hronous Sam pling)” on pa ge 43 • “Selectin g .
35 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est Probing the Device Under T est When using t he 16760A logi c analyzer , there are four probing options availab.
36 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est Y ou can order mating connector s separately using the Agilent part number: • 1253-3620 (or Samt ec #ASP-65067-01) Y ou can order support shrouds separatel y using the Agilent part numbers: • 16760-0230 2 for PC board thicknesse s up to 0.
37 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est If the clock input is a single-ended signal, eith er ground the negative clock input and adjust th e clock threshold voltage in the use r interface, or connect the negative clock inp ut to the DC clock threshold reference volt age.
38 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est Y ou can order mating connector s separately using the Agilent part number: • 1253-3620 (or Samt ec #ASP-65067-01) Y ou can order support shrouds separatel y using the Agilent part numbers: • 16760-0230 2 for PC board thicknesse s up to 0.
39 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est Using the E5380A Mictor -Compati ble Probe The E5380A MICTO R-compatible probe has a MICTOR connector end. If you have a device under test with connectors desi gned for the Agilent E534 6A high-density pro be adapter , you can also use the E5380A probe.
40 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est The clock input on the E5380A probe is single-ended. The cl ock threshold voltage may be adjusted independently o f the data threshold voltages.
41 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est single-ended signal. If the clock input i s a differential signal, select the "different ial" optio n in the clock threshol d user interface.
42 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est analysis syste m helps you to properly configu re the logic analyzer .
43 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de Choosing the Sampling Mode There are t hree logic analyzer samp ling modes to choose fro m : tim ing mode , state m ode , or eye scan mode . In timing mode , the logic analyzer samples asynchronou sly , based on an internally- generated sampling clock.
44 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode T o select the timing mode 1. Open the logic analyze r Setup w indow . 2. Selec t the Samp ling tab . 3. Choose t he T i ming Mo de opti on. Y ou can also select the tim ing sampling mode in the “Pod Assignment Dialog” on pa ge 17 5.
45 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de NOTE: If all pod s are used , memory de pth is reduced b y half in order to st ore the requ ired t ime tags . NOTE: W ith the Sam ple Period at 2. 5 ns, data is acqui red at two time s the trigger sequencer rate.
46 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode Selecting the State Mode ( Synchronous Sampling) In state mode , the logic analyzer sam ples synchron o usly , based on a sampling cloc k signal from the device under test.
47 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de T o select th e state mod e 1. Open the logic analyzer Setu p window . 2. Selec t the Samp ling tab . 3. Choose t he State Mode o ption. Y ou can also select the state sampling mode in the “Pod Assignment Dialog” on pa ge 17 5.
48 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode • 800 Mb/s / 64M State In t h is configura tion: Th e input clo ck signal can be p eriodic or aperio dic, and eith er risin g, falling, or both edges can indicat e valid data.
49 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de 3. Specify wh en to s ample. Y our choices are Rising Edge , Fa lling Edge , or Both Edges . Only Both Edges is available in the 1250 and 1500 Mb/s configur ations.
50 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode 6. In the Sampli ng Posit ions dia log, selec t the Eye Finder opt ion. 7. In the Ey e Finder Se tup tab, se lect the Use si gnals fro m Device Unde r Te s t option.
51 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de In the Eye Finder Results tab, you can see how the stable and transitioning areas vary over time. 3. Sele ct the Stop Eye Finder button. To v i e w eye finder data as a bus comp o site When you want a compressed, high-le vel view of the eye finder data: 1.
52 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode eye finder data must be saved a nd loaded se parately . 1. In the File Info tab, selec t the Save As... or Load... butto ns. Y ou can also choose the Save Eye Finder or Load Eye Finder command from th e Fil e me nu.
53 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de See Also “Underst anding Stat e Mode Sampl ing Posit ions” on page 2 56 “T o a utoma tical ly adj ust s am.
54 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode 1. In the Sa mplin g tab (or in the Sett ings su btab of the T r igger tab), select the a cquisi tion de pth. The number of sa mple s that can b e ch osen fo r the Acqu isit ion De pth ar e approximations.
55 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de turn it on agai n by s ele cting the Setup butto n in the Sy stem wind ow or by dragging the analyze r's instrument tool icon to the workspace in the W orkspace window .
56 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode configurati on, the input r eference clock e dges can occur at rates up to 800 MHz. Y ou can choose from: • 800 Mb/s / Eye Scan In t h is configura tion: Eith er rising, falling, or both e dges of t h e i n put reference clock can indicate valid data.
57 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes Formatting Labels for Logic Analyz er Probes The Format tab i s m ainly fo r assigning b us and si gnal names (from the device under test) , to logic analy zer channels.
58 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes Capt uring D ata on 17 Channe ls in St ate Mode On a single-card 1 6760A logi c analyzer in the state (synchronous) sampling mode, you can assign pod 2 to the logic analyzer and unassign pod 1.
59 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes appropriate thresho ld voltage r eference leve l. • Sel ect the Diffe rentia l opti on. This option ap pears when the E 5379A differ ential pr obe is use d .
60 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes 2. In the Clock Thres holds dialog, select th e button of the clock whose threshold vol tage you wish to set.
61 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes • Or , ch oos e the Insert b efore or Inse rt a fter command, ent er the la bel name, and select the OK butto n. 2. In the lab el row , selec t the butto n of the pod th at contai ns the ch annels you want to assign .
62 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes “T o ch ange the la bel pol arity” on page 64 T o import l abel names and assignments from a netlist Y ou can create label names and assign logic analyzer probe channels by importing n etlists.
63 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes “T o assig n probe channels to labe ls” on page 60 “T o impo rt labe l definit ions fr om a.
64 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes T o assign label name "O range" to channel s 15 through 5 on pod A3, channel 5 on pod A2.
65 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes Positive polarity means that a high voltage is a logic "1".
66 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes NOTE: Lab els with reor dered bi ts cannot be used as range te rms or <, <=,>, >= in trigge rs. T o turn labels off or on When you temporarily want to remove a label and its data, yo u can turn off the label.
67 3 Using the Logic Analyze r in T imi ng or State Mode • “Settin g Up T riggers and Running Measur ements” on pag e 69.
68 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode • “Usin g T rigg er Funct ions” on page 70 • “Usin g Ot her Trigger Fe ature s” on pa ge 75 • “Edi ting th e T rigg er.
69 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements Setting Up T riggers and Running Measurements This section describes setting up triggers for the tim ing and state sampling mo des and for all configur a tions wi t hin these modes.
70 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts State and transitional timing analysi s trigger definitions are made simpler with a defa ult sto rage qual ifier .
71 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements trigge r functi on. A pictu re des cribing t he tri gger funct ion is shown. 2. Sele ct the Replace button (or Insert before or In sert aft er butto n) to move it to t he T rigge r Sequenc e below .
72 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts “T o ent er symbol ic label values” on page 105 “Symbol s Selector Dialog” on page 195 T o sp ecify a label edge event Label edge e v ents let you specify edges and gl itches on a bus.
73 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements taken place). If y ou only wa nt to loo k the advan ced trig ger functi on, without ed iting it, you can expand the trigger function . 3.
74 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts description, and select the level s from the current tr igger sequence t hat be the trig ger functi on; then, s elect OK.
75 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements page 72 “Savin g/Recalling Trigger Setu ps” o n page 90 Using Other T ri gger Fe.
76 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts pod to be le ft unassign ed. See Also “T o sele ct the state sp eed config uration.
77 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements the contex t of the measur ement): a.
78 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts “T o s elect the conventi onal/trans itio nal config uration” on pa ge 44 T o sp.
79 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements • “T o clear the tr igger sequence” o n page 83 See Also “Seque nce Leve ls.
80 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts See Also “T o cut/cop y-and-paste sequence levels” on p age 80 T o cut/copy-an d.
81 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements evaluation of t he sample. Y ou can set up multi-way branches using advanced trigger functions or by selecting an If button and choosing Insert BRANC H .
82 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts Note that the e-mail is sent when the trigger occurs and not after the logic analyz er's acquisition memo ry is full. Y ou only need to specify one send e-mail action per trigger sequence.
83 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements • HTTP , F TP , SMTP and other pr otocols , each with defin ed sets of rule s to use w ith othe r Intern et points relativ e to a de fined s et of capabilit ies.
84 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts (label events), and the action is to trigger the logic analy z er .
85 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements 2. Enter an occurre nce count value. 3. If the occ urrenc e count is greate r than 1, se lect whe ther the e vent sho uld occur consecutively or eventually .
86 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts T o i nsert a time r event T ime r eve nts a re li ke othe r events in that they evaluate to either tr ue or fa lse.
87 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements 4. Enter the c ounter val ue. T o insert f lag actions/events Flags can be used to signal between modules in the logic analy sis system main frame, an expansio n frame, or in multiple frame s connected wi th the mult iframe module.
88 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts inse rt a Pulse set action for a fl ag in one analyzer , you cannot i nsert a Pulse clear action for the same flag in a different analyzer .
89 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements When driving the Port Out signal with a flag, you can sel ect the Feedthrough t ype to pas s the cur rent sta te of the fl ag (set or clear) direc tly t o Port Ou t.
90 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts T o give an event list a name 1. In the T ri gger ta b's T rig ger Seq uence ar ea, sele ct the If , If not , Else if , or Else i f not but ton, and c hoose Na me ev ent li st .
91 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements 3. Sel ect a memo ry locatio n to stor e the trig ger setup in. 4. In the B uffer Na me dialo g, enter a descrip tive name for the tri gger se tup.
92 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts Group Run Repet itive, or Run Al l button. Run starts on ly the i nstrument you are using. Sin gle run s gather d ata until t he l ogic analy zer m emory is full, and th en s top.
93 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements “Error Me ssages ” on page 211 T o vi ew the trigge r status While a logic analy.
94 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a Displaying Captured Data Once you have run a m easurement and fill ed the logic analyzer's acquisition memory with captured data, you can display the captur ed data with one of the displ ay tools.
95 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Displaying Capture d Data W aveform and Listing (and o ther) display tools provide global marke r s that can be used to correlate data that is captur ed by different instrumen t modules o r displayed differently i n other display tool windows.
96 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a 3. Drag th e display tool ic on and d rop it on the analyzer ic on. 4. T o open the disp lay tool, s elect its icon and choose t he Display command. Y ou can use the Chart display tool to chart the data on a l abel over time.
97 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Displaying Capture d Data Y ou can use the Serial Analysis toolset to convert streams of serial data into parallel words which are easier to view and analyze .
98 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a the actual writ e to this variable. Although the instruction is prefetched, the analyze r can be set to only t rigger when t he wri t e is e xecuted.
99 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Displaying Capture d Data 3. In the filte r terms , assure the de fault patter n of all "Don't C ares" (Xs) . This configurat ion will always transfer all data from acquisition memory .
100 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a T o cancel the displa y processing of captured data Y ou can cancel the processing o f captured data if it i s taking too long. 1. Select th e Cancel bu tton.
101 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s Using Symbols Y ou can use symbol names in place of data values when: • Setting up triggers • Displaying cap ture.
102 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s T o load object fil e symbols Object fi les are created by your compile r/linker or ot her software development too ls. 1. Ge nerate an ob ject fi le with symbolic inform ation usin g your softwar e deve lopment to ols.
103 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s the object f ile symbols are re loaded. T o delete objec t file symbol files 1. Sele ct the Symbol tab , and then the Object File tab. 2. Sele ct the fi le name yo u want to delete in the tex t box l abeled , Object Files with Symbols Loaded For Label .
104 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s whose symbols you wish to relo cate. 3. Sele ct the Relocate Sections... bu tton. 4. Enter the d esired o ffset in the Offset all sectio ns by field. The offs et is applie d from the li nked address or segme n t.
105 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s T o delete user -defined symbol s 1. Under th e Symbol tab, se lect the User Defined tab . 2. Sele ct the lab el you w ant to del ete sym bols from . 3. Sel ect the s ymbol to dele te.
106 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s Pattern . • Use the Fi nd Symbols of T ype sel ectio ns to filter the symbol s by type.
107 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s T o create a r eaders.ini fi le Y ou can change how an ELF/Stabs, T icoff or Coff/Stabs symbol file is processed by cr eating a reader .ini file. 1. Crea te the read er .
108 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s section will be read com pletely . This can occur i f the file was created without a "gener at e debugger informatio n" flag (usually -g). Using the - g will creat e a Dwarf or Stabs debug section in addition to the ELF section.
109 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s C MaxSymbolWidth=60 StabsType=2 Example for Coff/S tabs (using T icoff read er) [ReadersTicoff] C C MaxSymbolWidth=60.
110 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Printing/Ex porting Captured Data Printing/Exporting Captured Data T o print captured dat a Y ou can print captured data from displ ay tool windows. 1. In the display tool window , sel ect Print this wind ow from t he Fi le me nu.
111 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Print ing/E xpor ting Ca ptured Data 5. Select th e file name and automati c file sequenci ng options . 6. Sele ct the Read File butto n. 7. Drag disp lay , anal ysis, o r toolset icons an d drop t hem on th e File In tool icon t o view th e imported d ata.
112 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Cross-T riggering Cross-T riggering An instrument must be armed before it can l ook for a trigger . By default, instrume nts are set to be armed im mediately when you Run the measuremen t .
113 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Cross-T riggering 2. Choose t he Arm in from IMB menu it em. When t he logic anal yzer drives t he arm signal 1.
114 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Solving Logic Analy sis Proble ms Solving Logic Analysis Problems • “T o test the lo gic analyzer har dware” on page 1 14 See A.
115 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Solvin g Logic Anal y sis Problems If any test f ails, contact your local Agilent T echnologies Sales O ffice or Service Center for assistance.
116 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Saving a nd Loading Log ic Analyzer C onfigurations Saving and Loading Logic Analyzer Configurations The Agilent T echnologies 16760A logic analy z er settings a nd data can be saved to a conf iguration file.
117 4 Using the Logic Analyzer in Eye Scan Mode • “Se tting U p and R unnin g Eye Sca n Measur ements” on pag e 119.
118 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode • “Disp laying Captu red E ye Sc an D ata” o n pa ge 133 • “Saving and Loading Ca ptured Eye Scan Data” on page 152.
119 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments Setting Up and Running Eye Scan Measurements The Eye Scan tab le t s you set up and run Eye Scan measureme nts. Eye Scan measurements sample small windows of time and volt age on logic analyzer data channels.
120 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements when certain bus sign als transition in one of the device under test's operating modes an d o ther bus si gnals transition in a different operatin g mode.
121 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments T o quickly se t up another meas urement us ing the scale (see page 136) T o run an eye scan measureme nt 1.
122 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 1. In the Eye Scan tab, selec t the Ad vanced subtab.
123 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments memory device versus a memory control ler . Requir emen ts Qualified e ye scans are performed with double edge clocks. Qualified e ye scans are available only in the 800 Mb/s mode of the 16760 l ogic analyz er .
124 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements A suitable qualification sign a l is rare ly available. Instead, an extra circuit (added to the SUT , in a pro be adapter , or other convenient location ) is usually required to decode read/write commands and generate the qualif ier .
125 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments The qualifier is ch anged on the second clock cycle of the burst. It remains st able until after the next clock cycle following t he end of the burst.
126 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 3. If you have only one 16760 l ogic analyzer card, on the T rigger tab, se lect the Setti ngs subtab, and set Count to Off . This makes the second pod available for use by the qualifier .
127 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments 4. A ssign pod A2 to th e analyzer: • In the analyzer's Fo rmat tab sele ct the Pod Assignment button . •D r a g t h e A2 pod from the Unassigned P ods sect ion to the Analyzer section.
128 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 6. Select S ampling Positions ... to open the Samplin g Position s dialog. Select the label yo u create d and choose Expand to display al l the sign als (if it is not already expande d).
129 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments Now , set up eye scan mod e 1. Sele ct the Eye Scan bu tton o n the Sampling tab. Ensure that eye scan is set to 800 M b/s / Eye Sca n and the Master cl ock is set to Both Edges .
130 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 2. Sele ct the Eye Scan tab. 3. Sele ct the Qualifier subt ab.
131 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments 4. Sele ct the Qualify ey e scan sampling us ing... button. 5. Use t he Q ualificat ion Level buttons to select whether eye scan dat a is coll ected w hen the qua lifie r signal i s high or low .
132 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements Make e ye scan meas urements The logic analyz er is now ready to make qualified eye scan measurements. Select the r un icon to run t he eye scan.
133 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data Displaying Capture d Eye Scan Data Once you have run an eye scan measurement, captured measuremen t data is displ ayed as eye diagrams in the Eye Scan display .
134 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data NOTE: There is no Eye Scan disp lay too l icon in th e W ork space w indow b ecause the Eye Scan dis play does n't work with th e standar d form of capture d logic analy zer data (like, for example, the W aveform a nd Listin g display tools do ).
135 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data T o scale t he Eye Scan display The Eye S c an display' s scaling options on the Scale tab let you change the display scale of the captured eye scan data.
136 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data T o zoom-in on the disp l ayed dat a using t he click-and-dr ag method T o zoom in on a sele cted portion .
137 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data In the Dis pla y tab , you c an: • Cha nge the Display Mode . The Gray Sca le opt ion sho ws the me asure ment da ta in gray -scal e wher e the br ight ness of a re gion indica tes th e nu mber of tr ansiti ons d etected in that regi on.
138 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data The Solid Colo r option shows measurem ent data as a solid color in all regions whe re transitions were detected.
139 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data The Ch Densi ty Colo r opt ion s hows th e mea surem ent da ta i n colo r wher e the colo r of a regi on indicate s the number of logic anal yzer channe ls which have transitio ned in that region.
140 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data See Also “T o open th e Eye Scan display” on pa ge 133 “T o s cale the Eye Sca n d ispla y” on pag.
141 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data 3. Sele ct the Linear button to equally d ivide the color scale so that each color re pres ents an e qual in cremen t of tran sitions .
142 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data box associated with the white color bar t o bring out detail i n the eye diagram. The Default Limits button can be used to return the bl ac k and white limit v alues to settings that sho uld produce a typical eye d iagram.
143 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data •T u r n o n t h e 4 Pt Box tool . This tool is a b ox t hat di splay s time (box width), vo ltage (box height), and numbe r of trans itions d etected.
144 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data •T u r n o n t h e 6 Pt Box t ool. Th is tool is als o for me asuri ng time , volta ge, and the nu mber of transiti ons detect ed within th e area. The 6 Pt Box has 6 poi nts that can be re position ed to mat ch the shape of an eye .
145 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data •T u r n o n t h e Diamond tool. This too l is also f or measur ing ti me, voltage, and number of hi ts. Numbe r of hits refers to the number of transiti ons det ected wi thin th e area .
146 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data •T u r n o n t h e Sl ope T ool tool. Th is tool i s for me a su ring t he slope of rising and falling edges in an eye. It also shows the change in time and volta ge betwee n two poin ts.
147 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data •T u r n o n t h e Histogr am too l. Th is t ool d isplay s a histo gram of t he relative number of tran sitions at a particular voltage betwe en two times .
148 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data •T u r n o n t h e Cursor1 or Cursor2 tools. Cur sors are sin gle poin ts that disp lay the time and voltage wher e they are pos itioned. (T o display t he chan ge in time an d volta ge between two po ints, use the Slope tool instead of tw o cursors.
149 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data Any combination of t he measurement tools can be used at t he same time. Infor m ation fo r all select ed tools is disp layed. Y ou can use the scroll bars to navigate through the i nformation.
150 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data In the Info tab, you can: • View information about which logic analyzer the Eye Scan d ata is from, how many channels are dis played, and when the data was acquired.
151 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data point (see “T o set advanced eye scan options” on page 121), th e number of scan points that wer e measured, and the amount of system memory required fo r the data.
152 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Saving a nd Loading C aptured Ey e Scan Data Saving and Loading Captured Eye Scan Data When the logic analyzer configuration is saved with data , captur ed eye scan data is in c luded. Eye sc an data can be restored by loading a logic analyzer con figuration file.
153 5 Reference • “The Sa mpling T ab” on page 155 • “The Format T a b” on page 174 • “The T rigger T ab ” on page 176.
154 Chapter 5: Refer ence • “The S ymbols T ab” on pa ge 193 • “Error Me ssages” on page 211 • “Specifications and Characteristics” on pag e 227.
155 Chapter 5: Re ference The Sa mpling T ab The Sampling T ab The Sampling tab lets you choose bet ween the lo gic analyzer's: • Asynchr onous sampli ng T im ing Mode • Synchrono us samp ling State Mode • T ime and voltage scann ing (relative to a clock from the device under test) Eye Scan Mode.
156 Chapter 5: Refer ence The Sa mpling T ab T iming Mode When you select T iming Mode, the T iming Mode Controls area appears. Convent ional/ Tr a n s i t i o n a l Configura tion Lets you c onfigure.
157 Chapter 5: Re ference The Sa mpling T ab “In Either Timing Mode or State Mode” on page 53 How Samples are Store d in T ransitional T imi ng In the timing mode's 400 MHz / 32M Sample T ran.
158 Chapter 5: Refer ence The Sa mpling T ab State Mode When you select State Mo de, the State Mode Controls area appears. State Sp eed Configura tion Lets you con figur e the state ana lyzer for fas ter samplin g, but with half of the ch annels.
159 Chapter 5: Re ference The Sa mpling T ab as the sam pli ng clock. Generally , the state mode sam pling clock is taken from the signals that clock valid dat a in the device under test.
160 Chapter 5: Refer ence The Sa mpling T ab Sampling Positions T ab The Sampling Positions display is a digital "eye" diagr am in that it represent s many samples of data capture d in relation to the sam pling clock. The tr ansitioning edges me asured before and after the sampling clock result in a picture that is eye-shaped.
161 Chapter 5: Re ference The Sa mpling T ab view , set the sampl ing po sitio ns to the s uggested s ampling positio ns, and remove all eye finder data. Label bu ttons Let you e xpand/c olla pse the si gnals in a labe l, set the bus view , choose the suggest ed sampling position, and show message or time s tamp informati on.
162 Chapter 5: Refer ence The Sa mpling T ab How th e Selected Posi tion Behaves 1. When eye finder is enabled, t he select ed positi on (blue li ne) is set based on t h e man ual setu p/hold val ue. 2. When ever the select ed posi tion is moved, t he manu al setup/h old value is also updated.
163 Chapter 5: Re ference The Sa mpling T ab An eye finder measurement is curr ently running. Stop the eye finder or wait for it to complete be fore running the eye finder . The eye finder is already run ning on the other machine de fined for this analyzer .
164 Chapter 5: Refer ence The Sa mpling T ab "From Eye Fin der: After h ardware calibra tion, the samp ling position s for the follow i ng channe ls may have shifted out of th e selected stable regi on by the amount shown: CHANNEL: AMOUNT ps ... (NNN more)" Each time a measurement is started, the hardware is re-calibrated.
165 Chapter 5: Re ference The Sa mpling T ab request or when the Sampling Positi ons dialog is closed or iconified. "T imeout: < N K clocks in 5 sec" Eye finder requires sti m ulus at a minim um rate to perform its measurements. T oo few state cl ocks were seen in the time allotted.
166 Chapter 5: Refer ence The Sa mpling T ab 2. The stable region(s) are too small for eye finder to dete ct. In this case y ou must re sort t o adjust ing th e sam ple posi tion ma nually a nd checking its validit y by r unning an ordinary analyzer me asureme nt to see i f the data value s you expect ar e sampled.
167 Chapter 5: Re ference The Sa mpling T ab than 5 nsec and the clock period is greater than 10 nsec (slower than 100 MHz ). Eye Finder Load/Save Messages. These messages can appe ar when saving or lo ading eye finder data . "... (at line XX in the f ile)" Indicates wher e the error occurred in the file being read.
168 Chapter 5: Refer ence The Sa mpling T ab "Failed to open file for re ading/writi ng: NAME" The selected fi le could not be opened. Check access a nd file permissions. "File NA ME alread y exists. Overw rite?" The selected fi le exists.
169 Chapter 5: Re ference The Sa mpling T ab Eye Finder Setup T ab File m enu Lets you save /load eye finder data. EyeFinder menu Lets yo u run eye finder , choose the run mode, and access the “E ye Fi nder Advanc ed Se ttings Dia log” o n page 170.
170 Chapter 5: Refer ence The Sa mpling T ab channel will se lect it in each of thos e labels. See Also “Underst anding Stat e Mode Samplin g Position s” on page 2 56 “T o au tomatic ally a djust sa mpling position s” on pa ge 49 Eye Finder Advanced Settings Dialog.
171 Chapter 5: Re ference The Sa mpling T ab • Data buses that are driven b y different ci rcuitry at diffe rent time s. When differ ent channels require different se t tings, yo u can run eye finder on channel subsets to avoid usi n g the Long setting o n a large number of chan nels.
172 Chapter 5: Refer ence The Sa mpling T ab Relo ad Reloads ey e finder data from the name d file, dele ting unsaved change s. Save Saves cu rrent eye finder da ta to the named fi le.
173 Chapter 5: Re ference The Sa mpling T ab See Also “Sele cting t he Eye Scan Mode ” on page 55 “Underst anding Eye Scan Measureme nts” on page 25 9.
174 Chapter 5: Refer ence The Forma t T ab The Format T a b The Format tab is used to assign bus and signal names (from the device under test), to logic analyzer channels. T hese names are called labels . Labels are also used when setting up trigge rs and displaying captured data.
175 Chapter 5: Re ference The Format T ab Pod Assignment Dialog Name: Let s you nam e the ana lyzer. Ty p e : Lets yo u select the ti ming (asynch ronous) samp ling mode, the sta te (s ynchron ous) sampl ing m ode, o r turn the analyzer of f.
176 Chapter 5: Refer ence The T rigger T ab The T rigger T ab The T rigger tab i s used to tell the analyzer when to capture data. T he key event is the trigger . In the Agi lent T echnologies 16 760A logic analyzer , you can insert multiple t rigger actions.
177 Chapter 5: Re ference The T rigger T ab See Also “Underst anding Lo gic Analyzer T ri ggering ” on page 240 “Settin g Up T ri ggers and Running Measureme nts” on page 69 “Editi ng the T .
178 Chapter 5: Refer ence The T rigger T ab See Also • “Usin g T rigg er Funct ions” on page 70 • “Editing Adva nced T rigge r Functions (Timing or 200 Mb/ s State Only)” o n page 83 Gener.
179 Chapter 5: Re ference The T rigger T ab maximum width specifications. • Find Nth occurren ce of an edge Beco mes true when the specif ied edge occur s in the sp ecifi ed numb er of samp les.
180 Chapter 5: Refer ence The T rigger T ab • W ait for arm in When the logic anal yzer is a rmed by an oth er ins trume nt (a s sp ecif ied in the I ntermodu le window), this t rigger functio n becomes t rue w hen the arm signal is received. • W ait fo r fla g Become s true when the speci fied flag has the specified v alue .
181 Chapter 5: Re ference The T rigger T ab Y ou can expand these trigge r functions to see how they are constructed with th e underlying advanced trigger functions. Y ou can break down these trig ger functions to directly edi t the underlying ad va nced t rigger funct ions.
182 Chapter 5: Refer ence The T rigger T ab Become s true when the secon d specifie d patter n occurs in a sample (even t uall y) a fter a sample in whic h the first specif ied pattern occurs.
183 Chapter 5: Re ference The T rigger T ab When the logic anal yzer is a rmed by an oth er ins trume nt (a s sp ecif ied in the I ntermodu le window), this t rigger functio n becomes t rue w hen the arm signal is received. • W ait fo r fla g Become s true when the speci fied flag has the specified v alue .
184 Chapter 5: Refer ence The T rigger T ab are true, it e xecutes t he actions after "t hen". • Advanced - 2-way branch This tri gger fu nction has two branches, of the f orm "If - the n; else if - then ". For each sample, the events in the first "If" branch are checke d.
185 Chapter 5: Re ference The T rigger T ab • Advanced - patte rn1 OR pattern 2 Finds either patte rn1 or pattern2 or both in a sample . If you set it t o loo k for more th an 1 o ccurrence, you can spec ify whether the occurr ences are consec utive or not .
186 Chapter 5: Refer ence The T rigger T ab Y ou can use the following ty pes of events in these trig ger functions: patterns, ran ges, flags, and W ait for arm in (see “T o cross-tr igger with another instrument” on page 11 2). These trigger functions provide tri gger actions.
187 Chapter 5: Re ference The T rigger T ab captured data . For maxi mum data capt ure the trigg er position should be set to end . A warnin g messa ge conc erning no trigge r actio n will be displa yed in the Run Status windo w . This w arning m essage can be ign ored si nce the inte nt of the trig ger functi on is not to trig ger .
188 Chapter 5: Refer ence The T rigger T ab Sets up to n ever trigg er . Y o u mu st s elect t he s top bu tton to vi ew th e captured data . For maxi mum data capt ure the trigg er position should be set to end . A warnin g messa ge conc erning no trigge r actio n will be displa yed in the Run Status windo w .
189 Chapter 5: Re ference The T rigger T ab trigge r arm ing, and c omp ensat e for t iming skew betw een modules. See Also “T o specif y the sample per iod” on page 45 “T o set acquisiti on mem.
190 Chapter 5: Refer ence The T rigger T ab Default Storing Subtab Store by default Lets yo u spec ify tha t all eve nts ( Anything ), no events ( Nothing ), Custom (user defined ) events , or Tr a n s i t i o n s be stored by default. At st art of acquisition Lets yo u choos e wh ether defa ult s torin g is initi ally On or Off .
191 Chapter 5: Re ference The T rigger T ab Status Subtab The Status subtab shows you the sequen ce level that is evaluating captured data, occurrence an d global counter values, and flag values. See Also “T o view the tri gger status ” on page 93 Save/Reca ll Subtab The Save/Recall subt ab lets you save trigge r setups within a session.
192 Chapter 5: Refer ence The T rigger T ab Y ou can also save trigger sequences outside o f configuration fi les by creating trig ger function libraries.
193 Chapter 5: Re ference The Sym bols T ab The Symbols T ab The Symbols tab lets you l oad symbol files or define your own symbols. Symbols are names for particular data val ues on a label. T wo kinds of symbols are avail ab le: • Obje ct File Symbo ls.
194 Chapter 5: Refer ence The Symb ols T ab Object fil e versions During the load process, a symbol database file with a .n s extension will be creat ed by the system. One .ns database file will be creat ed for each symbol file y o u load. On ce the .
195 Chapter 5: Re ference The Sym bols T ab Symbols Selector Dialog Search Pa ttern: Lets you ente r partial symbol name s and the asteris k wildcard character (*) to limit the symbols to choose from (see “S earch Pattern” on page 196) . Use the Rec all button to select from previous search patterns .
196 Chapter 5: Refer ence The Symb ols T ab Of fset By Lets you add an offset value to the starting point of a symbol . This can be use f ul when c ompensating for micro proce ssor prefetch es ( see “Offset By O ptio n” on page 196). Align to Lets y o u mask t h e lower order bits of a symbol's va lue.
197 Chapter 5: Re ference The Sym bols T ab func1 and func2 are adjacent to each other in physical memory , with func2 following func1 . In or der to trigger o n fun c2 without getting a false trig ger from a prefetch beyond the e nd of f unc1 , you need to add an offset value to your label val ue.
198 Chapter 5: Refer ence The Symb ols T ab C++ notation. T o improve perf ormance for these ELF symbol files, type information is not associated with variables. H ence, some variables (typically a fe w local static variables) may not have the proper size associated with them.
199 Chapter 5: Re ference The Sym bols T ab The address or addr ess range must be a hexadecimal num ber . It must appear on the same l ine as the symbol name, and it must be separated from the symbol name by one o r more blank spaces or tabs. Address ranges must be i n the following format: beginning address.
200 Chapter 5: Refer ence The Symb ols T ab [START ADDRESS] address #comment text Lines without a precedin g header are assumed to be symbol defini t ions in one of the [ V ARIABLES] formats. Examp l e This is an exam ple GP A file that contain s several different kinds of reco rds.
201 Chapter 5: Re ference The Sym bols T ab NOTE: If you use section de finitio ns in a GP A symbol file, any subse quent fun ction or variab le defin ition s must be within th e addres s ranges of one of th e define d sections. Functions and variables that ar e not with in the range are ignored.
202 Chapter 5: Refer ence The Symb ols T ab V ARIABLES Y ou can specify symbols fo r variables using: • The address of the variable. • The address and the size o f the variable. • The range of addresses occupied by the variable. If you specify only the addr ess of a variable, the size is assumed to be 1 byte.
203 Chapter 5: Re ference The Sym bols T ab Examp l e [SOURCE LINES] File: main.c 10 00001000 11 00001002 14 0000100A 22 0000101E See Also Using th e Source Vi ewer (see the Listing Display T ool help volu me) ST AR T ADDRESS Format [START ADDRESS] address address The addre ss of the pr ogram entr y poin t, i n hexad ecim al.
204 Chapter 5: Refer ence The Eye Scan T ab The Eye Scan T ab The Eye Scan tab is used to set up and run eye scan measurem ents. • “Labe ls Subtab” on page 2 04 • “Scan Setti ngs Subtab” o.
205 Chapter 5: Re ference The Eye Sc an T ab Sele ct None De-selects all channels. See Also “T o select chann els for the eye scan” on pag e 119 Scan Settings Subtab Scan Ra nge Lets you choose fr om Coar se , Medium , or Fine time and volta ge sett ings .
206 Chapter 5: Refer ence The Eye Scan T ab normal ope rating mode by sampl ing signals fro m the device under test. See Also “T o set the eye scan r ange and resoluti on” on p age 120 Advanced Subtab Eye scan measurements look at selected l o gic analyzer channels for signals passing thr o ugh small windows of time and voltage.
207 Chapter 5: Re ference The Eye Sc an T ab and o ther anomal ies w ill b e dis playe d if pr esen t. Short Proce sses fewer clocks at each scan poi nt. This setting requir es freq uent tra nsitions on a ll channe ls. Mediu m Processes a moderate number of clocks at each scan po int.
208 Chapter 5: Refer ence The Eye Scan T ab Qualifier Subt ab Qua lif icat ion Leve l Select th e button that describe s the state in which you want Eye Scan to col lect data. Clock E d ge to Sampl e Qua lifie r Le vel Qual ified eye scans may only be pe rformed wit h double edge cloc ks.
209 Chapter 5: Re ference The Eye Sc an T ab Comments Subtab Y ou can enter your comments on t he eye scan settings. When t he logic analyzer configu ration is saved, comments are saved along with the eye scan settings.
210 Chapter 5: Refer ence The Calibr ation T ab The Calibration T a b All 16760A log ic analyzer cards m ust be calibrated to ensur e conformance to specifications. Calibrat ion Inst ructio ns Follow these instructions to calibrat e 16760A logic analyzer cards.
211 Chapter 5: Re ference Error Messages Error Me ssages • “Analyzer armed from another module contains no "Arm in from IMB" event ” on page 21 2 • “Branch expression is too comple.
212 Chapter 5: Refer ence Error Messa ges Analyzer armed from another modul e contains no "Arm in from IMB" event This warning i s displayed when a 16715 A and newer analyze r machine is in .
213 Chapter 5: Re ference Error Messages NOTE: For labe ls that do span pod pairs, t he comp lexit y can be re duced to th e same as tha t of the non- split la bel ca se if all b its in th e labe l on all b ut one pod pai r can be set to Xs in th e event list exp ression fo r the measure ment.
214 Chapter 5: Refer ence Error Messa ges • Canno t AND more than 16 non- split pa ttern ev ents if th e patte rn even ts are al l on the same pod pa ir . • Can AND up to 160 non- split patt ern events if the pat tern events a re evenly distribute d across all 10 pod pairs on a 5 card set (16 pattern even ts per pod pair).
215 Chapter 5: Re ference Error Messages 1 If (complex event list) occurs 1 time then goto next 2 If anything occurs 1 time then Goto Next 3 If (complex event list) occurs 1 time then Trigger and fill.
216 Chapter 5: Refer ence Error Messa ges Specific Guidelines - 800 Mb/s State Mode • Lab els that span pods (split labels) requ ire more combiner reso urces than labels with bits th at all be long to a si ngle pod. Wheneve r possibl e, define labels that do not span pods.
217 Chapter 5: Re ference Error Messages comb ine 2 non- split l abels tha t are AN Ded toge ther even thou gh it fai ls to compile a pattern on a singl e label that spans pods. • Cannot spe cify more tha n 3 pattern s or 1 range per po d. Non-split patterns may use operations: =, !=, <, <=,>, >=, In ra nge, Not in r ange.
218 Chapter 5: Refer ence Error Messa ges Counter value checked as an e vent, but no increment action specified This warning occurs b ecause you have used a counter in your trig ger sequence , but do not have Counter Inc rement as an action. Y ou do not need to incremen t the counter in the same sequence level.
219 Chapter 5: Re ference Error Messages Maximum of 32 Channels Per Label The logic analyz er can only assign up to 32 channels for each label . If you need mo re than 32 channels, assign them to two labels and use the labels in conjunction.
220 Chapter 5: Refer ence Error Messa ges Possible Solutio ns • Phras e some of th e edges as patte rns. For exam ple, if you are loo king fo r a rising edge o n a read/w rite li ne, you can check for R/W = 0 in o ne lev el foll owed by R/W = 1 in the ne xt leve l.
221 Chapter 5: Re ference Error Messages No T rigger action fo und in the trace specificati on This warning o ccurs when the trigger se q uence you spe cified does not have at least one trigger an d fill memory or trig ger and goto action. The analyzer will still acquire data, but you will ne ed to manually stop it.
222 Chapter 5: Refer ence Error Messa ges The clock's thres hold level is set by t he po d thres hold. For t he log ic analyzer's J clock, che ck the pod thresho ld of pod 1 of the master car d .
223 Chapter 5: Re ference Error Messages When you insert a trigger fun ction, the logi c analyz er sets up a field for you to ente r values . The fiel d length is ba sed on the num ber of bi ts assigne d to the fir st ac tive labe l, or the label you spec ify .
224 Chapter 5: Refer ence Error Messa ges The analyze r has a maximum lim it of 16 event list combiner reso urces. Each unique event list expression requir es the use of at least one of these combi ner resources. A complex event li st may re quire more t han one combiner resource.
225 Chapter 5: Re ference Error Messages • Event lists with up t o 4 u niqu e patter n eve nts can be com bined in an y combi nation of ANDs and ORs by a sin gle combiner reso urce if all of the pattern labels are no n-spli t and contained on the same pod pa ir .
226 Chapter 5: Refer ence Error Messa ges fetch at an address that is not properly aligne d, the trigger will ne ver be found. • T rigg er set inc orrect ly Some stra tegies you can use when verifying or debugging trigger sequence levels ar e: • Look at th e run sta tus message li ne or open the Run Sta tus window .
227 Chapter 5: Re ference Specifica tions and Charac teristics Specifications and Characteristics NOTE: For a complete comparison of all logic analyzer specificatio ns and characterist ics refer to th.
228 Chapter 5: Refer ence Specificatio ns and Characteristic s E5378A Single-Ended Probe Specifications and Characteri stics NOTE: All sp ecifi catio ns are ma rked by " *" (ast erisk ).
229 Chapter 5: Re ference Specifica tions and Charac teristics Maximum state data rate supported: 125 0 Mb/s Mating connector: Agi lent part # 1253-3620 (see note 1) Minimum voltage swing: Vpo s - Vneg >= 200 mV p-p Input dynamic range: -3. 0 Vdc to +5 Vdc Threshold accuracy: +/- (30 mV +1% of setting) (see note 4) Threshold range: -3.
230 Chapter 5: Refer ence Specificatio ns and Characteristic s Maximum input slew rate: 5 V /ns Clock input: Sin gle-ended Number of inputs (see note 5): 34 (32 data and 2 clock) Note 2: A kit containing 5 AMP MICTOR con nectors and 5 support shrouds is available, A gilent part # E5346-68701.
231 Chapter 5: Re ference Specifica tions and Charac teristics Data in to BNC port out: 150 ns Flag set/reset to evaluation: N/A Note 1: In the 1500 Mb/s mode, only the e ven-numbered channels (0,2,4,...etc.) are acqu ired. Note 2: The resolution of the hardware us ed to assign time tags is 4 ns.
232 Chapter 5: Refer ence Specificatio ns and Characteristic s 800 Mb/s Sampling Mode Speci fications and Characteri stics NOTE: All sp ecifi catio ns are ma rked by " *" (ast erisk ). Maximum data rate: E5378A, E5379A probes: 800 Mb/s E5380A probe: 600 Mb/s Minimum clock interval (active edge to active edge)*: E5378A, E5379A probes: 1.
233 Chapter 5: Re ference Specifica tions and Charac teristics 400 Mb/s Sampling Mode Speci fications and Characteri stics NOTE: All sp ecifi catio ns a re ma rked by " *" (ast erisk ). Maximum data rate: 400 Mb/s Minimum clock interval (active edge to active edge)*: 2.
234 Chapter 5: Refer ence Specificatio ns and Characteristic s 200 Mb/s Sampling Mode Speci fications and Characteri stics NOTE: All sp ecifi catio ns are ma rked by " *" (ast erisk ). Maximum data rate: 200 Mb/s Minimum clock interval (active edge to active edge)*: 5 n s Minimum state clock pulse width: 1.
235 Chapter 5: Re ference Specifica tions and Charac teristics Conventional T iming Mode Specifications a nd Characteri stics NOTE: All sp ecifi catio ns a re ma rked by " *" (ast erisk ).
236 Chapter 5: Refer ence Specificatio ns and Characteristic s Time interval accuracy: +/- [sample period + (chan-to-chan skew) + (0.01% of time interval)] Minimum data pulse width: 3.
237 Chapter 5: Re ference Specifica tions and Charac teristics referred to as an "operational accuracy calibration". What is a Ch aracteristic? Characteristics describe p r oduct perf ormance that is useful in t he application of the product, but that is not covered by t he product warranty .
238 Chapter 5: Refer ence Specificatio ns and Characteristic s.
239 6 Concepts • “Underst anding Lo gic Analyzer T ri ggering ” on page 240 • “Underst anding Stat e Mode Sampl ing Posit ions” on page 2 56 • “Underst anding Eye Scan Measureme nts”.
240 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering Understanding Logic Analyzer T riggering Setting up l ogic analyzer triggers c an be di fficult and time-consuming. Y ou could assume that if you know how to program, you should be able to set up a logic analyzer tri gger with no diffi culty .
241 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng placed on the co nveyor belt, and at the other end the boxes fall off. In other words, because logic analyzer mem o ry is lim ited in depth (number of samples), whenever a new sample is acquired the oldest sample curren t ly in memory is thrown away if the memory is ful l.
242 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering Special box Trigger point --------------------- ---------------- -------------- Next: “Summar y of T riggering Capabilities” on .
243 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng edge before it begins looking for the n ext rising ed ge. Because there is a sequence of st eps to find t he trigger , this is known as a trigg er sequence . Each step of the sequence is called a sequence level .
244 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering time. T wo sequence levels can never be used t o specify tw o events that happen simultaneously . For example, consider the following trigger sequence: 1. If ADDR = 1000 then Go to 2 2.
245 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng analyzer will never trigger . When the condi t ions are m et in a sequence level, i t is clear whi ch sequence level will be executed next when a “Go T o” action is used, but it is no t necessarily clear if there is no “Go T o”.
246 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering Branches Branches are similar to the Switch statem ent in the C progr amming language and the Selec t Cas e statement in Basic. They provide a method for testing multiple condit ions.
247 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng “not in rang e” function as well. Ranges are a convenient sho rtcut so that you don't have to specify “ADDR >= 1000 and ADDR <= 2000”. Next: “Flags” on page 247 Flags Flags are Boolean var iables that are used to send signals from one module to another .
248 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering be used in place of Global Coun t ers, if possible , b ecause they are easi er to use and because ther e is a limited number of Global Counters. Next: “T imers” on page 248 Ti m e r s T imers are used to check the amount of time that has elapsed between events.
249 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng because timer 1 will keep running and cond ition “T imer1 <500 ns” wi ll never be met. There might be another rising edge o n SIG1 that is followed wi t hin 500ns by t he rising edge on SIG 2 that occurs l ater on, so this situation is unacceptable.
250 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering ADDR In Range 1000 to 2000 By default, the Default Sto r age is set to stor e all samples acquired. Y ou can also set the Default Storage to store nothing, which means that no samples will be stored unl ess a sequence level overrides the def ault storage.
251 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng 1. If DATA = 005E then Trigger Else If ADDR in range 5000 to 6FFF then Store Sample Go to 1 Else If ADDR not in range 5000 to 6FFF then Don't Store Sample Go to 1 Alternatively , if t he default storage is set to “Store Every t hing”, use the following: 1.
252 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering The Agilent 16715A trigger user inter face Note that a picture (which corresponds to the selected function) is provided t o the ri ght of the trigger function list.
253 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng The same tri gger as If/Then st atements T rigger functions can be m o dified. For example, if you start with the function “ Find Edge”, you can add anothe r event, and it becomes the same as “Find Ed ge and Pattern”.
254 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering “Find E dge” and “Find Pattern” tog ether Next: “Set t ing U p Complex T riggers” on page 25 4 Sett ing Up Compl ex T riggers Frequently , the most difficult p art of setting up a complex trigger is breaking do w n the proble m.
255 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng different parts o f the trigger to describe how they work. Inline documentatio n on an Agi lent logic a nalyzer Next: “Conclusions” on page 255 Conclusi ons Setting up l ogic analyzer triggers i s very different than wri t ing software.
256 Chapter 6: C oncepts Unde rstan ding St ate Mode Sampli ng Posi tion s Understanding State Mode Sampling Positions Synchronous sam pling (state mode) l ogic analyzers are like edge- triggered fl i.
257 Chapt er 6: Concepts Underst anding Stat e Mode Sa m pli ng Positions T o position the setup/hold wind ow (sampling position) wi t hin the data valid window , a logic analyzer has an adjustable delay on each sampling clock input (to position the setup/hold window f or all the channels in a pod).
258 Chapter 6: C oncepts Unde rstan ding St ate Mode Sampli ng Posi tion s channel in a small fraction of the time (and without the extra test equipment) that it takes to make the adjustments manually . Eye finder is an easy way t o get t he smallest possible logic analyzer setup/hold window .
259 Chapt er 6: Concepts Unde rstanding Eye Scan Mea surements Understanding Eye Scan Measurements Eye scan measurement s are made possible by the lo gic analyzer's ability to double -sample each channel using sli ghtly offset delays and by comparing the delayed samples using an exclusive-OR operatio n.
260 Chapter 6: C oncepts Underst anding Eye Scan Measureme nts The result is a map of transitions detected in small windows of time and voltage over a r ange of time and voltage. Oscilloscope- like eye diagrams are used to display the m e asurement d ata.
261 Chapt er 6: Concepts Unde rstanding Eye Scan Mea surements Fine settings result i n higher eye diagram resolution, but because more samples are colle c ted, m easurements take longer to run. The picture below is an e x ample of measur ement results when the fine settings are used.
262 Chapter 6: C oncepts Underst anding Eye Scan Measureme nts The smallest time resolution that can be set i s 10 ps. The smallest voltage resolution that can be set is 1 mV . The number of channels on which an eye scan measurement collects data also aff ects the measurement time.
263 Glossar y absolute D enotes th e time peri od or count of states between a captured state a nd the trigger state . An absolute count of -10 indicat es the state was c aptured ten states before the trigge r state was capture d. acquisition Denote s one compl ete cycl e of data gather ing by a measur ement m odule .
264 Glossary pointing device, to cl ick an ite m, posi tion the curs o r over the item. Then quickl y press a nd releas e the left m ouse butto n . clock cha nnel A l ogic analyzer channel that can be used to carry the clock signal.
265 Glossary inst rument tool . Multi ple da ta s ets can be di splay ed togeth er wh en sourced in to a single displa y tool. Th e Filter tool i s used to pass o n parti a l data sets to a nalysis o r dis play tools .
266 Glossary Using th e T ouchscr een: Posit ion your fin ger over the item, then press and hol d finger to the scre en. While holdin g the finger down, sl ide the fi nger al ong the screen draggi ng the item to a new loca tion. Wh en the item is posit ioned where you wan t it, re leas e your finger .
267 Glossary logic analyze r what data y ou want to collect, such as which ch annels represent bu ses (labels) and what logi c thres hold you r sign als use . frame The Agilen t T echno logies or 16700A/B-ser ies logic analys is syste m mainfr ame. See als o logic analysis system .
268 Glossary is usu ally repr esen ted as dec imal numbers separated b y periods; for example, 192.35.12 .6. Ask your LAN adminis trator if you ne ed an inter net address. labels Labels are used to group and iden tify logi c anal yzer c hanne ls. A labe l con sists o f a na me and an associated bit or gro up of bits.
269 Glossary machine becau se th e master car d is in slo t C of the ma infram e. The ot her cards of the modul e are called expansion car ds . menu bar T he menu ba r is locat ed at the top of a ll window s. Use it to select File ope rations, tool or sys tem Options , and t ool o r sy stem leve l Help .
270 Glossary by the channel width of the instr ument. pod See pod p air point T o point to an item , move the mous e cur sor o ver t he i tem, or posi tion your finger over the i tem.
271 Glossary measurem ent as part of it s data acquisition cycle. Sampl ing Use the se lections u nder the lo gic anal yzer S ampli ng tab to tell the logic analyzer how yo u want to make measurements, such as State vs.
272 Glossary symbols Symbol s represen t patterns and ra nges of values f ound on labeled se ts of bits. T wo kinds of symbols are available: • Obje ct file symbo ls - Symb ols from your source code, and symbol s generated by your compil er . Object file symbo ls may repres ent gl obal vari able s, functi ons, labe ls, and source l ine numbe rs.
273 Glossary timing measur e ment In a tim ing measurement, the logic analy zer samp les dat a at regul ar in terval s according to a clock signal inter nal to the t iming analy zer . Sinc e the analyzer is clocked by a signal that is not relate d to the sy stem und er test, timing meas urements capture traces of ele ctrica l activ ity o ver tim e.
274 Glossary field . This action allo ws you to select spec ific por tions of a partic ular waveform in acquisition memory that will be displa yed on the s creen.
275 Symbols & , 84 *, bi t as signm ent , 60 +, label polarity , 64 -, label polarity , 64 ., bit unass ignment , 60 Numeri cs 1250 Mb /s / 128M Half Chan ne l configurati on , 47 1250 Mb /s state.
276 Index bit numbers of logic analy zer channels , 60 bit order , changing , 65 bit signif icance , 60 bits, r eordering , 65 boolean expres sions , 245 branches , 246 branches, trigger sequence , 80.
Index 277 counter 2 value checked as an event, but no i ncrement action spec ified , 218 counter actions , 86 counter e vents , 86 counter warning me ssage , 218 counters, global , 86 counters, occurr.
278 Index expo rtin g label defi nitions to an ASCII fi le , 64 expressions, boolean , 245 external ref erence (th reshold voltage) , 35 external refer ence threshold voltage , 58 eye fi nder , 46 , 4.
Index 279 Fin d patter n2 occ urri ng immediat ely after pat tern1 , 181 Find pa tter n2 occu rri ng too lat e after pa ttern1 , 182 Fin d patter n2 occ urr ing t oo soon after pa ttern1 , 182 Find t .
280 Index label pol arity , 64 label values , 71 label values, symbolic , 105 labels , 22 , 57 labels subtab, ey e scan , 204 labels, as signing ch annels t o , 60 lab els, assi gnin g to logic a naly.
Index 281 posi tive l ogic , 64 pred efined t rigger func tions , 177 pref etch, trigg ering beyo nd , 196 preprocessors (analysis probes) , 41 presen t for > , 84 preserv ing b it ass ignment s , .
282 Index setting clock threshold voltages , 59 setting pod threshold voltages , 58 setting the advanced eye scan options , 12 1 settin g the eye scan range , 120 settin g the eye sc an resolut ion , .
Index 283 symbols , loadi ng user -defin ed , 10 5 symbols, outside define d sections , 107 symbols, types and use , 19 3 symbols , user -d efined , 104 symbols, using , 101 synchronous sampli ng , 16.
284 Index triggers, strateg ies for setting up , 251 troubleshooting the logic analyzer , 114 turbo st ate trigger functio ns , 185 U una ssign ed bits , 60 unas signed po d requi red , 75 understandi.
P u b l i c a t i o n N u m b er : 5 98 8 -9044 EN s1 January 1, 2003.
Un punto importante, dopo l’acquisto del dispositivo (o anche prima di acquisto) è quello di leggere il manuale. Dobbiamo farlo per diversi motivi semplici:
Se non hai ancora comprato il Agilent Technologies 16760A è un buon momento per familiarizzare con i dati di base del prodotto. Prime consultare le pagine iniziali del manuale d’uso, che si trova al di sopra. Dovresti trovare lì i dati tecnici più importanti del Agilent Technologies 16760A - in questo modo è possibile verificare se l’apparecchio soddisfa le tue esigenze. Esplorando le pagine segenti del manuali d’uso Agilent Technologies 16760A imparerai tutte le caratteristiche del prodotto e le informazioni sul suo funzionamento. Le informazioni sul Agilent Technologies 16760A ti aiuteranno sicuramente a prendere una decisione relativa all’acquisto.
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